Patent · US Expired

Semiconductor integrated circuit device

US5825193A · kind A · utility

17Cited by
8References
4Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 18, 1995
Grant dateOct 20, 1998
Priority date
Expiry dateDec 18, 2015

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/2849
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A semiconductor integrated circuit apparatus having a plurality of semiconductor integrated circuit devices, each of the plurality of semiconductor devices including a semiconductor integrated circuit formed on a semiconductor substrate, a reference voltage input terminal formed on the semiconductor substrate which is operative for receiving a reference voltage input from outside of the semiconductor substrate, and a burn-in voltage control circuit formed on the semiconductor substrate operative for receiving the reference voltage which is output from the reference voltage input terminal. The burn-in voltage control circuit generates a burn-in supply voltage which is input to the semiconductor integrated circuit, and also maintains the burn-in supply voltage at the reference voltage level such that each of the integrated circuits receives a burn-in supply voltage having the same voltage level.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.