Shin Hashimoto
86Patents
17h-index
118Co-inventors
87Inventor score
Filing activity: Jul 17, 1992 → Apr 2, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5645628A | Electroless plating bath used for forming a wiring of a semiconductor device, and method of forming a wiring of a semiconductor device | Chemistry; Metallurgy | 162 | Expired |
| US5945834A | Semiconductor wafer package, method and apparatus for connecting testing IC terminals of semiconductor wafer and probe terminals, testing method of a semiconductor integrated circuit, probe card and its manufacturing method | Physics | 100 | Expired |
| US6005401A | Semiconductor wafer package, method and apparatus for connecting testing IC terminals of semiconductor wafer and probe terminals, testing method of a semiconductor integrated circuit, probe card and its manufacturing method | Physics | 84 | Expired |
| US5468983A | Semiconductor device and method of manufacturing the same | Electricity | 80 | Expired |
| US5706281A | Data transfer system | Electricity | 54 | Expired |
| US5296719A | Quantum device and fabrication method thereof | Emerging Cross-Sectional Technologies | 34 | Expired |
| US6919574B2 | Electron beam exposure apparatus, deflection apparatus, and electron beam exposure method | Electricity | 26 | Expired |
| US6207427A | Method for producing optically active compound | Chemistry; Metallurgy | 25 | Expired |
| US5795828A | Electroless plating bath used for forming a wiring of a semiconductor device, and method of forming a wiring of a semiconductor device | Chemistry; Metallurgy | 25 | Expired |
| US6319099A | Apparatus and method for feeding slurry | Performing Operations; Transporting | 23 | Expired |
| US6917045B2 | Electron beam exposure apparatus, electron beam exposure apparatus calibration method, and semiconductor element manufacturing method | Electricity | 22 | Expired |
| US7312530B2 | Semiconductor device with multilayered metal pattern | Electricity | 22 | Expired |
| US5300814A | Semiconductor device having a semiconductor substrate with reduced step between memory cells | Emerging Cross-Sectional Technologies | 21 | Expired |
| US6308316A | Apparatus for analyzing operations of parallel processing system | Physics | 21 | Expired |
| US5405800A | Method of fabricating a semiconductor memory device | Electricity | 19 | Expired |
| US6323663A | Semiconductor wafer package, method and apparatus for connecting testing IC terminals of semiconductor wafer and probe terminals, testing method of a semiconductor integrated circuit, probe card and its manufacturing method | Physics | 17 | Expired |
| US5825193A | Semiconductor integrated circuit device | Physics | 17 | Expired |
| US6585560B2 | Apparatus and method for feeding slurry | Performing Operations; Transporting | 15 | Expired |
| US5641699A | Method of manufacturing a semiconductor device having a dummy cell | Electricity | 15 | Expired |
| US6774379B2 | Electron beam exposure apparatus and deflection amount correction method | Electricity | 13 | Expired |
| US6784442B2 | Exposure apparatus, control method thereof, and device manufacturing method | Electricity | 11 | Expired |
| US6291350A | Method of polishing semiconductor wafer | Performing Operations; Transporting | 9 | Expired |
| US7884393B2 | High electron mobility transistor, field-effect transistor, and epitaxial substrate | Electricity | 8 | Active |
| US7582394B2 | Photomask and method for forming pattern | Physics | 8 | Active |
| US7741207B2 | Semiconductor device with multilayered metal pattern | Electricity | 7 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.