Semiconductor test system
US5828985A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Nov 20, 1996 |
| Grant date | Oct 27, 1998 |
| Priority date | — |
| Expiry date | Nov 20, 2016 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2201/865
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A software structure in a semiconductor test system for easily modifying and transferring data for controlling a hardware when the hardware is changed or replaced. The semiconductor test system includes, an input for providing a test program for specifying various test conditions necessary to test the semiconductor device under test, a master processor for converting the test program to an object code and interpreting the contents of the test program, a processor interface for storing data indicating the hardware characteristics of the semiconductor test system in a table format to assist the interpretation of the test program in the master processor and modifying the table format data in response to the change in the hardware, a library having data tables based on the specification of the semiconductor test system for converting the format of the data compiled and interpreted by the master processor to data of a hardware format, and a driver for transmitting the hardware format data to registers in the hardware of the semiconductor test system through a data bus.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.