Patent · US Expired

Methods and apparatus for sputtering with rotating magnet sputter sources

US5830327A · kind A · utility

64Cited by
9References
17Claims
0Family size

Assignee

Inventor

Key dates

Filing dateOct 2, 1996
Grant dateNov 3, 1998
Priority date
Expiry dateOct 2, 2016

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J37/3455
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A magnetron sputtering source for forming a sputtered film on a substrate in a magnetron sputtering apparatus includes a target having a surface from which material is sputtered and a magnet assembly that is rotatable about an axis of rotation with respect to the target. The magnet assembly produces on the target an erosion profile that is calculated to yield a desired depositional thickness distribution and inventory. A method for configuring the rotatable magnet assembly includes the steps of determining an optimal erosion profile that yields the desired depositional thickness distribution and inventory, determining a plasma track on the surface of the target that produces an acceptable approximation to the optimal erosion profile, and determining a magnet structure that produces the plasma track.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.