Patent · US Expired

Antifuse detect circuit

US5831923A · kind A · utility

33Cited by
12References
35Claims
0Family size

Assignee

Inventor

Key dates

Filing dateAug 1, 1996
Grant dateNov 3, 1998
Priority date
Expiry dateAug 1, 2016

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C7/067
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An antifuse detect circuit senses the conductance of a programmable element, such as an antifuse or fuse, and provides a logic output corresponding to the state of the programmable element. A capacitor precharges a comparator input above its input voltage trip point. The programmable element discharges the comparator input below the trip point depending upon its conductance state. The circuit allows quick and accurate sensing of the state of the programmable element, even when it is only marginally conductive, and improves reliability of the programmable element. The programmable element is used in remapping memory cells such as in a dynamic random access memory (DRAM). The state of the programmable element is sensed during precharging of addressing logic, and optionally latched when a row address strobe (RAS) signal is asserted.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.