Patent · US Expired

Method for forming interconnections in an integrated circuit

US5851919A · kind A · utility

0Cited by
3References
52Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMay 6, 1997
Grant dateDec 22, 1998
Priority date
Expiry dateMay 6, 2017

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S257/921
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

The invention provides a method for producing wiring and contacts in an integrated circuit including the steps of forming insulated gate components on a semiconductor substrate; applying a photo-reducible dielectric layer to cover the substrate; etching holes and forming contacts; photo-reducing the dielectric to increase its conductivity; covering the resulting structure with an interconnect layer; etching the interconnect layer to define wiring in electrical contact with the contacts; and oxidizing the dielectric to reduce its conductivity.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.