Test board for testing a semiconductor device and method of testing the semiconductor device
US5854558A · kind A · utility
18Cited by
9References
10Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 21, 1995 |
| Grant date | Dec 29, 1998 |
| Priority date | — |
| Expiry date | Sep 21, 2015 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L2224/45144
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test board used for testing a semiconductor device provided with projection electrodes includes a main board and testing electrodes. The testing electrodes are provided on the main board, each projecting upwardly from the main board. When the semiconductor device is tested, the testing electrodes are electrically connected to the projection electrodes by insertion of the testing electrodes into the projection electrodes. The semiconductor device is mounted on the main board to test the semiconductor device through the testing electrodes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.