Method and apparatus for synchronizing a mode locked laser with a device under test
US5854804A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Dec 13, 1996 |
| Grant date | Dec 29, 1998 |
| Priority date | — |
| Expiry date | Dec 13, 2016 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/311
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and an apparatus for synchronizing a mode locked laser with a device under test. The present invention provides a stroboscopic technique that synchronizes the free running laser pulses of a mode locked laser to a DUT enabling the optical testing of integrated circuits to be performed and waveform measurements to be acquired from a DUT at random operating frequencies. In one embodiment, a laser synchronizing apparatus is configured to be used to test a device under test . The laser synchronizing apparatus includes a mode locked laser generating repeating laser pulses having a first period. A test pattern operating in M clocks when executed on the device under test is constructed. M is an integer and each one of the M clocks has a second period. A time per test pattern is computed such that the time per test pattern provides a sufficient amount of time to execute the constructed test pattern operating in the M clocks. The time per test pattern is a common multiple of the first period and the second period such that N laser pulses are generated during the time per test pattern with N being an integer. The test pattern is looped on the device under test with the laser synchron…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.