Patent · US Expired

Method for manufacturing self-aligned split-gate flash memory cells

US5856223A · kind A · utility

17Cited by
4References
18Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMay 21, 1997
Grant dateJan 5, 1999
Priority date
Expiry dateMay 21, 2017

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10B41/30

Abstract

A method for manufacturing self-aligned split-gate flash memory cells wherein the split-gate structure is formed by a self-aligned approach, so that the length of a channel can be precisely controlled. Furthermore, sources and drains are formed separately by executing different implantations, so that the dopant parameters of the sources and drains can be changed, based on desired and possibly different characteristics.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.