Method of analyzing waveforms
US5859811A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Feb 29, 1996 |
| Grant date | Jan 12, 1999 |
| Priority date | — |
| Expiry date | Feb 29, 2016 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V1/48
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of analyzing a spatial series of waveforms, each waveform of which contains components arising from at least two substantially uncorrelated features, includes the steps of sorting the waveforms into groups or bins according to values of one or more of the features, determining a mean waveform for each group or bin, subtracting the mean waveform from each waveform in the group or bin, returning the waveforms to the original order of the series and determining a remaining feature. Binning, the process of sorting waveforms into groups based on values of features, can be performed for one feature determined from the waveform or for several features. All that is required is that the binning criteria are substantially uncorrelated with the feature of interest. An example of a binning criterion can be frequency or period of a component of the waveform. Also a value of a physical parameter calculated from the waveform can be used as a binning criterion.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.