Apparatus and method for automated testing of a progammable analog gain stage
US5861774A · kind A · utility
17Cited by
1References
27Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Dec 16, 1996 |
| Grant date | Jan 19, 1999 |
| Priority date | — |
| Expiry date | Dec 16, 2016 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/3167
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A Built-In Self-Test (BIST) circuit and test method are employed for automated testing of a programmable analog gain stage. The BIST circuit and operating method advantageously use the natural redundancy of a multiple-channel circuit for detecting circuit faults. More specifically, the BIST circuit utilizes the natural redundancy of the identical signal paths for multiple-channel, such as stereo, audio operation. A left channel and a right channel ideally function identically so that a fault in one channel of the left channel and the right channel signal paths is detected by mutually comparing the operation of the two channels.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.