Process for producing a silicon capacitor
US5866452A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Feb 10, 1997 |
| Grant date | Feb 2, 1999 |
| Priority date | — |
| Expiry date | Feb 10, 2017 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D1/711
Abstract
To produce a silicon capacitor, hole apertures at whose surface a conductive zone (40) is formed by doping and whose surface is provided with a dielectric layer (6) and a conductive layer (7) are generated in an n-doped silicon substrate (1). To compensate for mechanical strains in the silicon substrate (1) brought about by the doping of the conductive zone (40), the conductive zone (40) is additionally doped with germanium which is outdiffused from a germanium-doped layer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.