GMSK communication device test system
US5875213A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Feb 5, 1997 |
| Grant date | Feb 23, 1999 |
| Priority date | — |
| Expiry date | Feb 5, 2017 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L27/2332
- WIPO fieldDigital communication
- WIPO sectorElectrical engineering
Abstract
A communication device test system is unnecessary to consider a phase offset between reproduced ideal data and phase data to be measured. The communication device test system includes AD converters for sampling two rectangular signals, an offset detector for determining offset and amplitude values which are a center of phase rotation, a phase detector for producing phase data from data subtracted by the offset, a differentiator for converting the phase data to a frequency data, a DFT which squares the frequency data and performs a DFT function to produce a bit rate frequency, a bit data regenerator which generates, when receiving the frequency data and bit rate frequency, bit data through a demodulation process, an ideal data generator for generating ideal frequency data, a difference calculation part for calculating the difference between the frequency data and the ideal data, and an integration/phase error detector which converts the error data to phase information and determines a root mean square phase error.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.