Methods for roughening and volume expansion of trench sidewalls to form high capacitance trench cell for high density dram applications
US5877061A · kind A · utility
41Cited by
17References
14Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 25, 1997 |
| Grant date | Mar 2, 1999 |
| Priority date | — |
| Expiry date | Feb 25, 2017 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S438/964
Abstract
Trench cells with increased storage capacity are prepared with roughened sidewalls using a layer of grainy polysilicon or hemispherical grain polysilicon. The top collar region of the trench is protected with oxide while the lower portion of the trench coated with polysilicon or hemispherical grain polysilicon is etched isotropically. The trench structure created has roughened sidewalls for increased volume of storage.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.