Patent · US Expired

Methods for roughening and volume expansion of trench sidewalls to form high capacitance trench cell for high density dram applications

US5877061A · kind A · utility

41Cited by
17References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 25, 1997
Grant dateMar 2, 1999
Priority date
Expiry dateFeb 25, 2017

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/964

Abstract

Trench cells with increased storage capacity are prepared with roughened sidewalls using a layer of grainy polysilicon or hemispherical grain polysilicon. The top collar region of the trench is protected with oxide while the lower portion of the trench coated with polysilicon or hemispherical grain polysilicon is etched isotropically. The trench structure created has roughened sidewalls for increased volume of storage.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.