Patent · US Expired

Reading circuit for semiconductor memory cells

US5883837A · kind A · utility

8Cited by
5References
40Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 29, 1997
Grant dateMar 16, 1999
Priority date
Expiry dateSep 29, 2017

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C7/06
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A read circuit for semiconductor memory cells, comprising first and second active elements coupled to a supply line via at least a first switch, wherein the first and second active elements are respectively connected, at first and second circuit nodes, respectively, to a first transistor through which the active elements are coupled to a ground. These first and second circuit nodes are also connected to ground through first and second capacitive elements, respectively, each having a switch connected in parallel to the capacitive element.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.