Patent · US Expired

Read circuit and method for nonvolatile memory cells with an equalizing structure

US5886925A · kind A · utility

24Cited by
6References
29Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 18, 1997
Grant dateMar 23, 1999
Priority date
Expiry dateJun 18, 2017

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C16/28
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

The read circuit presents a current mirror circuit including a first and second load transistor interposed between the supply line and a respective first and second output node. The first output node is connected to a cell to be read, the second output node is connected to a generating stage generating a reference current having a predetermined characteristic, and the size of the second load transistor is N times greater than the first load transistor. To permit rapid cell reading even in the presence of low supply voltage and with no initial uncertainty, an equalizing circuit presents a current balancing branch connected between the first output node and ground for generating an equalizing current presenting a ratio of 1/N with the reference current to balance the circuit before commencing the reading.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.