Patent · US Expired

Nonvolatile memory device with verify function

US5886927A · kind A · utility

87Cited by
4References
15Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJul 9, 1998
Grant dateMar 23, 1999
Priority date
Expiry dateJul 9, 2018

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C16/3459
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

One verify cell is connected to one word line, together with a plurality of array cells, and has a threshold value almost the same as the array cells. A write voltage or an erase voltage is applied to the array cells, setting the voltage applied to the verify cell at a small value, thereby electrically changing the threshold value of the verify cell. Alternatively, the sense ratio of a sense amplifier is changed with respect to the output of the verify cell and the output of a reference cell, thereby electrically changing the apparent threshold value of the verify cell. Data is thereby written into or erased from the array cells earlier than into or from the verify cell. Hence, the verification of the memory cells is accomplished by when the verify cell is verified.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.