Patent · US Expired

Flexible reset scheme supporting normal system operation, test and emulation modes

US5894176A · kind A · utility

3Cited by
15References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 4, 1994
Grant dateApr 13, 1999
Priority date
Expiry dateMay 4, 2014

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/31701
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A structure and a method are provided to implement a reset scheme for an integrated circuit supporting a variety of testing and debugging equipment. The control and I/O pins of the integrated circuit are each set to a high impedance state when the signals of a reset pin and a mode pin are both asserted. If the signal on the mode pin remains asserted at the time the signal on the reset pin is negated, the control and I/O pins of the integrated circuit remain in the high impedance state until the next time the signal on the reset pin is asserted. Otherwise, the control and I/O pins of the integrated circuits are enabled upon negation of the signal on the reset pin. In one embodiment, the mode pin is multiplexed with an pin used for receiving interrupt signals during functional operation.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.