Technique for increasing manufacturing yield of matrix-addressable device
US5897414A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Oct 24, 1995 |
| Grant date | Apr 27, 1999 |
| Priority date | — |
| Expiry date | Oct 24, 2015 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J2329/00
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
The yield in manufacturing matrix-addressable devices, particularly flat-panel CRT displays, is increased by a technique in which a determination is first made that a defect exists in part of a first matrix-addressable plate structure (20) of a unitary first active area (32). This typically entails testing a group of the first plate structures to determine whether any of them are defective. The defective part or parts of each defective first plate structure are also identified. At least one non-defective first plate structure normally is subsequently converted into a first matrix-addressable device of the first active area. For a defective first plate structure identified in the testing, the defective part of the structure is removed in such a way that the remainder of the structure forms a second matrix-addressable plate structure (84) of a second active area (32A) smaller than the first active area. The second plate structure is normally tested and, if non-defective, is subsequently converted into a second matrix-addressable device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.