Patent · US Expired

Power device integration for built-in ESD robustness

US5903032A · kind A · utility

27Cited by
2References
19Claims
0Family size

Assignee

Inventor

Key dates

Filing dateFeb 10, 1997
Grant dateMay 11, 1999
Priority date
Expiry dateFeb 10, 2017

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002

Abstract

A power device having built-in ESD protection. A drain extended NMOS transistor (12) is located in a tank region (18). A silicon controlled rectifier (14) is merged with the drain extended nMOS (12) into the tank region (18). In one aspect of the invention, an anode (28) of the silicon controlled rectifier (14) is connected to a drain (24) of the drain extended nMOS (12) and a cathode (32) of the silicon controlled rectifier (14) is connected to a source (34) of the drain extended nMOS (12).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.