Patent · US Expired

Ballast monitoring for radio frequency power transistors

US5907180A · kind A · utility

10Cited by
10References
3Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 22, 1997
Grant dateMay 25, 1999
Priority date
Expiry dateJan 22, 2017

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

The present invention, generally speaking, provides an apparatus and method whereby the current flow through an RF power transistor may be monitored without the use of any external parts. More particularly, in accordance with one embodiment of the invention, an RF power transistor includes a silicon die, a pair of interdigitated electrodes formed on the silicon die, each having a multiplicity of parallel electrode fingers and at least one bond pad. Regions of a first type of diffusion are formed beneath electrode fingers of one electrode of the pair of interdigitated electrodes, and regions of a second type of diffusion are formed beneath electrode fingers of another electrode of the pair of interdigitated electrodes. One electrode has multiple electrode fingers and multiple resistors formed on the silicon die, at least one resistor connected in series with each one of the electrode fingers. A further electrode is provided having at least one electrode finger and connected to a further bond pad, and at least one resistor is formed on the silicon die and connected in series with the further electrode. In accordance with another embodiment of the invention, a method is provided for m…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.