Lookahead structure for fast scan testing
US5909453A · kind A · utility
18Cited by
10References
21Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 2, 1997 |
| Grant date | Jun 1, 1999 |
| Priority date | — |
| Expiry date | Jul 2, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318541
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A scan lookahead skip structure that allows a programmable number of test bits, I/O blocks, flip-flops, or columns to be skipped. One embodiment of the structure includes multiplexers to skip the scan paths for several adjacent I/O blocks, flip-flops, or columns, thereby reducing the number of clock cycles and overall delay required to utilize the scan path.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.