Patent · US Expired

Method for forming layer of hemispherical grains and for fabricating a capacitor of a semiconductor device

US5909625A · kind A · utility

6Cited by
3References
6Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJun 9, 1997
Grant dateJun 1, 1999
Priority date
Expiry dateJun 9, 2017

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/964

Abstract

A method for forming a layer of hemispherical silicon grains having a desired density and a desired shape in order to increase the surface area of the storage electrode of a capacitor. The method involves the formation of a thin oxide film over an under silicon layer to be formed with hemispherical silicon grains, so that the formation of those hemispherical silicon grains can be carried out in such a manner that the hemispherical silicon grains have a desired density and a desired shape under given conditions irrespective of whether or not the under silicon layer is doped with impurity ions and of the crystalline structure of the under silicon layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.