Patent · US Expired

Scalable flash EEPROM memory cell, method of manufacturing and operation thereof

US5912843A · kind A · utility

56Cited by
11References
26Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJan 31, 1997
Grant dateJun 15, 1999
Priority date
Expiry dateJan 31, 2017

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D64/035
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A scalable flash EEPROM cell has a semiconductor substrate with a drain and a source and a channel therebetween. A select gate is positioned over a portion of the channel and is insulated therefrom. A floating gate has a first portion over the select gate and insulated therefrom, and a second portion over a second portion of the channel and over the source, and is between the select gate and the source. A control gate is over the floating gate and is insulated therefrom. A memory array using this memory cell is also disclosed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.