Patent · US Expired

Method for flash EEPROM data writing

US5912844A · kind A · utility

22Cited by
8References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 28, 1998
Grant dateJun 15, 1999
Priority date
Expiry dateJan 28, 2018

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C16/10
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Method for writing data to a NOR-type flash memory array including loading page data to a bit-latch buffer, programming cells to low threshold voltage V.sub.t, and programming cells to high V.sub.t. Programming cells to high V.sub.t by either: Channel Hot Electron Injection (CHEI) or Source Side Injection (SSI). CHEI releases the band-to-band induced hot hole damage while SSI further reduces the sector size to be the same as page size for NOR-type flash EEPROM memory.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.