Patent · US Expired

Lateral gate vertical drift region transistor

US5917203A · kind A · utility

60Cited by
2References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 31, 1997
Grant dateJun 29, 1999
Priority date
Expiry dateMar 31, 2017

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D62/8503

Abstract

A lateral gate, vertical drift region transistor including a drain positioned on one surface of a substrate and a doped structure having a buried region therein positioned on the other surface of the substrate. The buried region defining a drift region in the doped structure extending vertically from the substrate and further defining a doped region in communication with the drift region and adjacent the surface of the doped structure. A source positioned on the doped structure in communication with the doped region and an implant region positioned in the doped region adjacent the surface and in communication with the source and buried region. An insulating layer positioned on the doped structure with a metal gate positioned on the insulating layer so as to define an inversion region in the implant region extending laterally adjacent the control terminal and communicating with the drift region and the source.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.