Method and apparatus for repairing opens on global column lines
US5917763A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Sep 12, 1997 |
| Grant date | Jun 29, 1999 |
| Priority date | — |
| Expiry date | Sep 12, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/832
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A memory array arranged in rows and columns includes a global column line. The global column line has proximal and distal ends and is adapted to enable a predetermined number of columns in the array. A repair circuit connected to the distal end of the global column line is adapted to detect a fault on the global column line and disable the global column line if the fault is detected. A repair circuit for a signal line includes a programming circuit and a sensing circuit. The programming circuit includes a programmable element and is adapted to detect a fault on the signal line and program the programmable element if the fault is detected. The sensing circuit is adapted to detect a programmed condition of the programmable element and ground an end of the signal line in response to the programmed condition. A method for repairing a memory array having a global column line includes detecting a fault on the global column line of the array and disabling the global column line if the fault is detected.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.