Mura detection apparatus and method
US5917935A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | May 22, 1996 |
| Grant date | Jun 29, 1999 |
| Priority date | — |
| Expiry date | May 22, 2016 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02F1/136259
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A method and apparatus for identifying and classifying pixel defects, and in particular Mura defects using digital processing techniques. The present method includes steps of acquiring an image with a Mura defect, and performing a Laplacian convolution on the image to enhance the Mura defect against background illumination. A step of thresholding the Mura defect against the background illumination is also provided. The thresholded Mura defect is compared against the original Mura defect to define statistical parameters of the original Mura defect. An annular region is defined around the periphery of the Mura defect. Statistics of the annular region defines statistics for background illumination as compared to the original Mura defect. The statistics from the Mura defect are then compared to the background illumination statistics for Mura defect classification and analysis.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.