Patent · US Expired

Field controlled semiconductor device of SiC and a method for production thereof

US5923051A · kind A · utility

10Cited by
2References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 17, 1997
Grant dateJul 13, 1999
Priority date
Expiry dateOct 17, 2017

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D62/8325

Abstract

A field controlled semiconductor device of SiC comprises superimposed in the order mentioned at least a drain (12), a highly doped substrate layer (1) and a low doped n-type drift layer (2). It has also a highly doped n-type source region layer (6) and a source (11) connected thereto. A doped channel region layer (4) connects the source region layer to the drift layer, and a current is intended to flow therethrough when the device is in an on-state. The device has also a gate electrode (9). The channel region layer has a substantially lateral extension and is formed by a low doped n-type layer (4). The gate electrode (9) is arranged to influence the channel region layer from above for giving a conducting channel (17) created therein from the source region layer to the drift layer a substantially lateral extension.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.