Patent · US Expired

Single level gate nonvolatile memory device and method for accessing the same

US5929478A · kind A · utility

27Cited by
10References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 2, 1997
Grant dateJul 27, 1999
Priority date
Expiry dateJul 2, 2017

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10B69/00

Abstract

A single level gate NVM device (20) includes a floating gate FET (11) and a capacitor (12) fabricated in two P-wells (27, 28) formed in an N-epitaxial layer (22) on a P-substrate (21). P+ sinkers (29, 31) and N-type buried layers (25, 26) provide isolation between the two P-wells (27, 28). The NVM device (20) is programmed or erased by biasing the FET (11) and the capacitor (12) to move charge carriers onto or away from a conductive layer (36) which serves as a floating gate (14) of the FET (11). Data is read from the NVM device (20) by sensing a current flowing in the FET (11) while applying a reading voltage to the capacitor (12).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.