Patent · US Expired

Zero thermal budget manufacturing process for MOS-technology power devices

US5933733A · kind A · utility

14Cited by
15References
53Claims
0Family size

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Key dates

Filing dateJun 21, 1995
Grant dateAug 3, 1999
Priority date
Expiry dateJun 21, 2015

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/26586
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A zero thermal budget manufacturing process for a MOS-technology power device. The method comprises the steps of: forming a conductive insulated gate layer on a surface of a lightly doped semiconductor material layer of a first conductivity type; removing the insulated gate layer from selected portions of the semiconductor material layer surface; implanting a first dopant of a second conductivity type into the selected portions of the semiconductor material layer, the insulated gate layer acting as a mask and the first dopant of the first conductivity type being implanted in a dose and with an implantation energy suitable to obtain heavily doped regions substantially aligned with the edges of the insulated gate layer; implanting a second dopant of the second conductivity type along directions at prescribed angles with respect to a direction orthogonal to the semiconductor material layer surface, the insulated gate layer acting as a mask, the second dopant being implanted in a dose and with an implantation energy suitable to obtain lightly doped channel regions extending under the insulated gate layer; and implanting a third dopant of the first conductivity type into the heavily dop…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.