Patent · US Expired

High speed MOS-technology power device integrated structure, and related manufacturing process

US5933734A · kind A · utility

12Cited by
19References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 4, 1997
Grant dateAug 3, 1999
Priority date
Expiry dateMar 4, 2017

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D64/519

Abstract

A high-speed MOS-technology power device integrated structure includes a plurality of elementary functional units formed in a lightly doped semiconductor layer of a first conductivity type, the elementary functional units including channel regions of a second conductivity type covered by a conductive insulated gate layer including a polysilicon layer; the conductive insulated gate layer also including a highly conductive layer superimposed over the polysilicon layer and having a resistivity much lower than the resistivity of the polysilicon layer, so that a resistance introduced by the polysilicon layer is shunted with a resistance introduced by the highly conductive layer and the overall resistivity of the insulated gate layer is lowered.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.