Contact probe arrangement for functional electrical testing

US5939893A · kind A · utility

Assignee

• International Business Machines Corporation · US

Inventors

• Gerhard Elsner · Kaarst, DE
• Johann Greschner · Neckartenzlingen, DE
• Roland Stoehr · Nufringen, DE

Key dates

• Filing date: Mar 24, 1997
• Grant date: Aug 17, 1999
• Expiry date: Mar 24, 2017

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R1/07357
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A contact probe arrangement for electrical functional testing, including a first stack of perforated plates, a second stack of perforated plates and a plurality of contact probes. The probes are in contact with the second stack of perforated plates, and in communication with the first stack, the probes are arranged and dimensioned such that the probes are capable of lateral buckling and capable of being guided through the first stack. The contact probe arrangement also includes a test card, a counterholding piece attached to the test card, and a pressure plate, the pressure plate movably connected to the test card. The first perforated plate is connected to the second perforated plate such that the first perforated plate is capable of movement toward and away from the second perforated plate and the second perforated plate is connected to the first perforated plate such that the second perforated plate is capable of movement toward and away from the first perforated plate.