Patent · US Expired

Method for manufacturing an electronic structure

US5946600A · kind A · utility

20Cited by
5References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 8, 1997
Grant dateAug 31, 1999
Priority date
Expiry dateApr 8, 2017

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH05K2203/1142
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A process for manufacturing an electronic interconnect structure, the process including the steps of depositing an adhesion metal layer over a dielectric material surface having at least one exposed aluminum surface; depositing a barrier metal layer over the adhesion metal layer; depositing a first layer of aluminum over the barrier metal layer; depositing an intermediate barrier metal layer over the first layer of aluminum; applying a photoresist layer on top of the intermediate barrier metal layer; exposing and developing the photoresist layer; removing the exposed barrier metal and photoresist layer, leaving a layer of barrier metal over the aluminum layer; converting those portions of the layer of aluminum which are not covered by barrier metal to a porous aluminum oxide by porous anodization; removing the porous aluminum oxide; and removing the exposed barrier metal and adhesion metal layers to leave exposed patterned aluminum, and an electronic interconnect structure manufactured by this method.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.