Method and system for performing non-standard insitu burn-in testings
US5954832A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Mar 14, 1997 |
| Grant date | Sep 21, 1999 |
| Priority date | — |
| Expiry date | Mar 14, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/076
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and system for performing non-standard insitu burn-in testings is disclosed. In accordance with the method and system of the present invention, a transition counter is provided for each of the integrated-circuit (IC) devices under test. A set of scan strings is transmitted to the transition counter in each of the IC devices while the IC devices are operating under a high-temperature /high-voltage environment. A determination is then made as to whether or not a value from the transition counter in each of the IC devices operating under the high-temperature environment is within a predefined range in response to the transmitted scan strings. An indicator associated with each of the IC devices operating under the high-temperature/high-voltage environment is set in response to the transition counter value that occurred outside the predefined range. The IC devices that do not have the indicator set are subsequently tested again with the IC devices operating in room temperature and nominal voltage. Each IC device that passes the second test will be accepted.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.