Johnny LeBlanc
17Patents
8h-index
36Co-inventors
72Inventor score
Filing activity: Feb 21, 1989 → Apr 14, 2017
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5568380A | Shadow register file for instruction rollback | Physics | 100 | Expired |
| US6055658A | Apparatus and method for testing high speed components using low speed test apparatus | Physics | 38 | Expired |
| US6901546B2 | Enhanced debug scheme for LBIST | Physics | 31 | Expired |
| US6539491B1 | Method and apparatus for implementing IEEE 1149.1 compliant boundary scan | Physics | 27 | Expired |
| US6665828B1 | Globally distributed scan blocks | Physics | 21 | Expired |
| US6452435B1 | Method and apparatus for scanning and clocking chips with a high-speed free running clock in a manufacturing test environment | Physics | 20 | Expired |
| US4852061A | High density, high performance register file having improved clocking means | Physics | 14 | Expired |
| US6240536A | Scanable latch circuit and method for providing a scan output from a latch circuit | Electricity | 11 | Expired |
| US5954832A | Method and system for performing non-standard insitu burn-in testings | Physics | 7 | Expired |
| US6748563B1 | Method and apparatus for testing path delays in a high-speed boundary scan implementation | Physics | 6 | Expired |
| US10105245B2 | Stent graft assembly for treating branched vessels | Human Necessities | 3 | Active |
| US9408689B2 | Iliac stent graft | Human Necessities | 2 | Active |
| US8214170B2 | Test pattern compression | Physics | 2 | Active |
| US6389577B1 | Analyzing CMOS circuit delay | Physics | 1 | Expired |
| US10639180B2 | Systems and methods for deploying a portion of a stent using an auger-style device | Human Necessities | 0 | Active |
| US9655756B2 | Systems and methods for deploying a portion of a stent using an auger-style device | Human Necessities | 0 | Active |
| US9956096B2 | Assembly for treating branched vessels | Human Necessities | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.