Cache array defect functional bypassing using repair mask
US5958068A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Apr 14, 1997 |
| Grant date | Sep 28, 1999 |
| Priority date | — |
| Expiry date | Apr 14, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2212/1032
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method of bypassing defects in a cache used by a processor of a computer system. A repair mask has an array of bit fields corresponding to cache lines in the cache, and when a particular cache line in the cache is identified as being defective, a corresponding bit field in the repair mask array is set to indicate that the particular cache line is defective, and further access to the defective cache line is prevented, based on the corresponding bit field in the repair mask array. The repair mask can be used to prevent the defective cache line from ever resulting in a cache hit, and to prevent the defective cache line from ever being chosen as a victim for cache replacement. Using a set associative cache, the defective cache line is thereby effectively removed from its respective congruence class. This approach allows the cache to use all non-defective cache lines without any cache lines being reserved for redundancy.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.