Application specific integrated circuit chip and method of testing same
US5963566A · kind A · utility
16Cited by
10References
15Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 18, 1996 |
| Grant date | Oct 5, 1999 |
| Priority date | — |
| Expiry date | Dec 18, 2016 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/10
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An application specific integrated circuit having an embedded microprocessor and core including a memory array, self tests at full operational speed utilizing the computational power of the embedded microprocessor for deterministic testing performed by core specific test algorithms implemented in the assembly code of the embedded microprocessor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.