Method for application of weighted random patterns to partial scan designs
US5968194A · kind A · utility
35Cited by
11References
10Claims
0Family size
Assignee
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Key dates
| Filing date | Mar 31, 1997 |
| Grant date | Oct 19, 1999 |
| Priority date | — |
| Expiry date | Mar 31, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318586
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for using weighted random patterns in a partial scan test. A computer generates deterministic patterns on the partial scan design. Deterministic patterns that have the same number of capture clocks between adjacent scan loads are grouped together into pattern groups. A computer then determines a set of weights corresponding to each of the pattern groups. A tester then uses these weights as a filter to weighted random test patterns and applies these filtered weighted random test patterns along with the appropriate number of capture clock pulses to a device under test.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.