Patent · US Expired

Circuit and method of reading cells of an analog memory array, in particular of the flash type

US5973959A · kind A · utility

34Cited by
7References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 22, 1998
Grant dateOct 26, 1999
Priority date
Expiry dateJul 22, 2018

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C2211/5645
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A reading circuit comprises a current mirror circuit connected, at a first and a second output node, to the drain terminals of an array cell and of a reference cell; a comparator whose inputs are connected to the output nodes of the current mirror circuit; a ramp generator having an enabling input connected to the output of the comparator and an output connected to the control terminal of the reference cell. Biasing the gate terminal of the array cell to a constant voltage, when the currents flowing in the array cell and in the reference cell are equal, the value assumed by the ramp voltage is proportional to the threshold value of the array cell; at that time the comparator is triggered and discontinues the ramp increase, supplying as output the desired threshold value.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.