Patent · US Expired

Ferroelectric based memory devices utilizing low curie point ferroelectrics and encapsulation

US5977577A · kind A · utility

14Cited by
13References
10Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJul 29, 1996
Grant dateNov 2, 1999
Priority date
Expiry dateJul 29, 2016

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D1/696

Abstract

A ferroelectric memory cell for storing information. The information is stored in the remnant polarization of a ferroelectric dielectric layer by setting the direction of the remnant polarization. The ferroelectric memory cell is designed to store the information at a temperature less than a first temperature. The memory cell includes top and bottom contacts that sandwich the dielectric layer which includes a ferroelectric material having a Curie point greater than the first temperature and less than 400.degree. C. The dielectric layer is encapsulated in an oxygen impermeable material such that the encapsulating layer prevents oxygen from entering or leaving the dielectric layer. One of the contacts is typically includes a platinum electrode. The other contact may include a similar electrode or a semiconductor layer having electrodes spaced apart thereon.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.