Patent · US Expired

Dendrite interconnect for planarization and method for producing same

US5977642A · kind A · utility

15Cited by
16References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 25, 1997
Grant dateNov 2, 1999
Priority date
Expiry dateAug 25, 2017

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T29/49155
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method is provided for connecting two conductive surfaces in an electronic circuit package comprising the steps of forming dendrites on selected regions of a first conductive surface, applying a dielectric insulation material over the first conductive surface such that the dendrites are exposed through the insulation material to leave a substantially planar surface of exposed dendrites, and placing a second conductive surface on top of the exposed dendrites. The second conductive surface may be a surface metal, a chip bump array, or a ball grid array. Also claimed is an electronic circuit package incorporating the dendrites used for electrical interconnection and planarization manufactured in accordance with the present invention.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.