Patent · US Expired

Metal removal cleaning process and apparatus

US5980647A · kind A · utility

46Cited by
10References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 15, 1997
Grant dateNov 9, 1999
Priority date
Expiry dateJul 15, 2017

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB08B2203/0288
  • WIPO fieldChemical engineering
  • WIPO sectorChemistry

Abstract

A megasonic liquid stream semiconductor wafer cleaning apparatus and method uniformly removes debris from all points on the surface of a semiconductor wafer. The wafer is rotated about a proscribed axis while the means for producing focused megasonic waves and a liquid stream of cleaning fluid is focused on the wafer so as to apply sufficient energy to clean the wafer yet not cause damage to the electronic circuity embedded in the wafer. A method is provided for moving the outlet port providing the stream of megasonic cleaning fluid across the wafer so that the amount of energy applied to any area of the wafer is relatively constant.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.