Patent · US Expired

Method of manufacturing thin film and method for performing precise working by radical control and apparatus for carrying out such methods

US5980999A · kind A · utility

39Cited by
6References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 28, 1996
Grant dateNov 9, 1999
Priority date
Expiry dateMar 28, 2016

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/302
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A first reactive gas is introduced into a vacuum chamber and a plasma of the thus introduced reactive gas is produced. A second reactive gas is introduced into a radical generating chamber and is dissociated to generate radicals whose density and composition are well controlled. Then, the thus generated radicals are injected into the plasma generated within the vacuum chamber such that an amount of a desired kind of radicals within the plasma is selectively increased or decreased. In this manner, a thin film having an excellent property can be deposited on a substrate placed in the vacuum chamber. Alternatively, a surface of a substrate placed in the vacuum chamber can be processed precisely and selectively.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.