Method for fabricating semiconductor device
US5985757A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Apr 5, 1996 |
| Grant date | Nov 16, 1999 |
| Priority date | — |
| Expiry date | Apr 5, 2016 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L21/321
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A method for fabricating highly integrated semiconductor devices with capacitors having a dielectric film comprised of a thin film exhibiting a high dielectric constant to obtain a sufficient capacitance, involving the formation of an under electrode over a wafer formed with an oxide film at a high temperature, and annealing the resulting wafer in a vacuum such that the under electrode has a tight and smooth structure. By virtue of the tight and smooth structure of the under electrode, subsequent processing steps can be easily carried out. It is also possible to achieve an improvement in the reliability and uniformity of semiconductor devices as well as a high integration of such semicoductor devices.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.