Patent · US Expired

Methods of making high voltage GaN-AlN based semiconductor devices and semiconductor devices made

US5990531A · kind A · utility

63Cited by
4References
2Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 12, 1997
Grant dateNov 23, 1999
Priority date
Expiry dateNov 12, 2017

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D62/8503
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

The present invention is directed to a technique for manufacturing semiconductor devices in which p type GaN is formed on a substrate and semi-insulating AlN is formed on the P type GaN with n type GaN formed on the p type GaN and partially below the AlN. Highly efficient high power and high voltage semiconductor devices are formed through this technique having better or similar properties to silicon type semiconductors.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.