Patent · US Expired

Semiconductor processing furnace heating control system

US5994675A · kind A · utility

77Cited by
18References
34Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 7, 1997
Grant dateNov 30, 1999
Priority date
Expiry dateMar 7, 2017

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/67103
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A vertically oriented thermal processor supporting semiconductor wafers within a vertical processing chamber within a process tube about which a furnace heater is supported utilizes a model-base control target in combination with a heating control system configured to heat portions of the furnace in order to achieve a thermally uniform processing chamber environment. A furnace power controller implements a dynamic control system configured to achieve a desired uniform thermal distribution within the processing chamber during various processing cycles for semiconductor wafers. Preferably, the control system monitors thermal conditions within the chamber and compares the conditions with a desired thermal model of the furnace, and activates/deactivates one or more heater elements within the furnace in order to achieve a desired thermal condition within the processing chamber.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.