Patent · US Expired

Semiconductor device and process for production thereof

US6005291A · kind A · utility

23Cited by
3References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 21, 1998
Grant dateDec 21, 1999
Priority date
Expiry dateAug 21, 2018

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A semiconductor device comprising an insulating film at least partially containing a fluorine-containing film, formed above a semiconductor substrate, and a titanium nitride film formed on the insulating film. The above titanium film functions as a barrier metal film for barriering the diffusion of fluorine (F) atoms.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.