Patent · US Expired

Abrasive construction for semiconductor wafer modification

US6007407A · kind A · utility

61Cited by
32References
14Claims
0Family size

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Inventors

Key dates

Filing dateAug 20, 1997
Grant dateDec 28, 1999
Priority date
Expiry dateAug 20, 2017

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB24D3/28
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

An abrasive construction for modifying a surface of a workpiece, such as a semiconductor wafer. The abrasive construction comprises: a three-dimensional, textured, fixed abrasive element; at least one resilient element generally coextensive with the fixed abrasive element; and at least one rigid element generally coextensive with and interposed between the resilient element and the fixed abrasive element, wherein the rigid element has a Young's Modulus greater than that of the resilient element.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.