Circuit arrangement for measuring leakage current utilizing a differential integrating capacitor
US6011403A · kind A · utility
69Cited by
3References
5Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Oct 31, 1997 |
| Grant date | Jan 4, 2000 |
| Priority date | — |
| Expiry date | Oct 31, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2851
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A circuit arrangement for use in a semiconductor integrated circuit tester for measuring leakage current supplied from a pin of a semiconductor integrated circuit device under test (DUT) to a programmed voltage level includes a voltage source having an output terminal, a feedback mechanism connected between the DUT pin and the voltage source for controlling the voltage source to force the DUT pin to the programmed voltage level, a capacitor connected between the output terminal of the voltage source and the DUT pin, and a circuit for measuring voltage developed across the capacitor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.